Detection and control of ferroelectric domains by an electrostatic force microscope.

Autor: Hong, J. W., Kahng, D. S., Shin, J. C., Kim, H. J., Khim, Z. G.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1998, Vol. 16 Issue 6, p2942-2946, 5p
Databáze: Complementary Index