Detection and control of ferroelectric domains by an electrostatic force microscope.
| Autor: | Hong, J. W., Kahng, D. S., Shin, J. C., Kim, H. J., Khim, Z. G. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1998, Vol. 16 Issue 6, p2942-2946, 5p |
| Databáze: | Complementary Index |
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