Chemically amplified resist processing with top coats for deep-ultraviolet and e-beam applications.

Autor: Petrillo, Karen, Bucchignano, James, Angelopoulos, Marie, Cornett, Kathleen, Brunsvold, William
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1998, Vol. 16 Issue 6, p3709-3715, 7p
Databáze: Complementary Index