Modification of YBa2Cu3O7-δ wires using a scanning tunneling microscope: Process and electrical transport effects.
Autor: | Bertsche, G., Clauss, W., Prins, F. E., Kern, D. P. |
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Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1998, Vol. 16 Issue 6, p3883-3886, 4p |
Databáze: | Complementary Index |
Externí odkaz: |