Modification of YBa2Cu3O7-δ wires using a scanning tunneling microscope: Process and electrical transport effects.

Autor: Bertsche, G., Clauss, W., Prins, F. E., Kern, D. P.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1998, Vol. 16 Issue 6, p3883-3886, 4p
Databáze: Complementary Index