Evaluation of diamond-ground beveled surfaces with Hg gate capacitance-voltage and current-voltage.
| Autor: | Hillard, R. J., Sherbondy, J. C., Hartford, C. L., Weinzierl, S. R., Mazur, R. G. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1998, Vol. 16 Issue 1, p411-414, 4p |
| Databáze: | Complementary Index |
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