Layer-by-layer etching of HgI2 films and crystals by scanning force microscopy.
| Autor: | Lang, H. P., Erler, B., Rossberg, A., Piechotka, M., Kaldis, E., Güntherodt, H.-J. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p970-973, 4p |
| Databáze: | Complementary Index |
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