Chromosome classification by atomic force microscopy volume measurement.

Autor: McMaster, T. J., Winfield, M. O., Baker, A. A., Karp, A., Miles, M. J.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p1438-1443, 6p
Databáze: Complementary Index