Scanning tunneling microscope for magneto-optical imaging.

Autor:	Prins, M. W. J., Groeneveld, R. H. M., Abraham, D. L., Schad, R., van Kempen, H., van Kesteren, H. W.
Zdroj:	Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p1206-1209, 4p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu