Sub-10 nm lithography and development properties of inorganic resist by scanning electron beams.

Autor: Fujita, J., Watanabe, H., Ochiai, Y., Manako, S., Tsai, J. S., Matsui, S.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1995, Vol. 13 Issue 6, p2757-2761, 5p
Databáze: Complementary Index