Calibration, drift elimination, and molecular structure analysis.
| Autor: | Jo\rgensen, J. F., Madsen, L. L., Garnaes, J., Carneiro, K., Schaumburg, K. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1994, Vol. 12 Issue 3, p1698-1701, 4p |
| Databáze: | Complementary Index |
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