Experimental and theoretical determinations of gate-to-emitter stray capacitances of field emitters.

Autor: Busta, H. H., Pogemiller, J. E., Chan, W., Warren, G.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1993, Vol. 11 Issue 2, p445-448, 4p
Databáze: Complementary Index