Focused ion beam and transmission electron microscopy method for root cause analysis of InP ridge laser devices.
| Autor: | Griswold, E. M., Sharma, U., Phaneuf, M. W. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 2004, Vol. 22 Issue 3, p930-934, 5p |
| Databáze: | Complementary Index |
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