Low-temperature Ar/N2 remote plasma nitridation of SiO2 thin films.

Autor: Khandelwal, Amit, Niimi, Hiro, Lucovsky, Gerald, Lamb, H. Henry
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 2002, Vol. 20 Issue 6, p1989-1996, 8p
Databáze: Complementary Index