Surface derivatization of nanoscale tungsten probes for interfacial force microscopy.

Autor: Graham, J. F., Griffiths, K., Kovar, M., Norton, P. R., Ogini, F., Warren, O. L.
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1999, Vol. 17 Issue 4, p2240-2245, 6p
Databáze: Complementary Index