Studies of the low-pressure inductively-coupled plasma etching for a larger area wafer using plasma modeling and Langmuir probe.

Autor: Collison, Wenli Z., Ni, Tom Q., Barnes, Michael S.
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1998, Vol. 16 Issue 1, p100-107, 8p
Databáze: Complementary Index