Influence of strain on semiconductor thin film epitaxy.

Autor: Fitzgerald, E. A., Samavedam, S. B., Xie, Y. H., Giovane, L. M.
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1997, Vol. 15 Issue 3, p1048-1056, 9p
Databáze: Complementary Index