Influence of strain on semiconductor thin film epitaxy.
Autor: | Fitzgerald, E. A., Samavedam, S. B., Xie, Y. H., Giovane, L. M. |
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Zdroj: | Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1997, Vol. 15 Issue 3, p1048-1056, 9p |
Databáze: | Complementary Index |
Externí odkaz: |