Defect production and recombination during low-energy ion processing.

Autor: Kellerman, B. K., Floro, J. A., Chason, E., Brice, D. K., Picraux, S. T., White, J. M.
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1995, Vol. 13 Issue 3, p972-978, 7p
Databáze: Complementary Index