Sub-centimeter micromachined electron microscope.

Autor: Feinerman, A. D., Crewe, D. A., Perng, D. C., Shoaf, S. E., Crewe, A. V.
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1992, Vol. 10 Issue 4, p611-616, 6p
Databáze: Complementary Index