Effect of oxygen on fluorine-based remote plasma etching of silicon and silicon dioxide.
Autor: | Loewenstein, Lee M. |
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Zdroj: | Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1988, Vol. 6 Issue 3, p1984-1988, 5p |
Databáze: | Complementary Index |
Externí odkaz: |