An edge-defined technique for fabricating submicron metal-semiconductor field effect transistor gates.

Autor: Strifler, W. A., Cantos, B. D.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1990, Vol. 8 Issue 6, p1297-1299, 3p
Databáze: Complementary Index