Test of band offset commutativity by photoemission from an in situ grown ZnTe/CdS/ZnTe quantum well.
| Autor: | Wilke, W. G., Maierhofer, Ch., Horn, K. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1990, Vol. 8 Issue 4, p760-767, 8p |
| Databáze: | Complementary Index |
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