Soft x-ray core level photoemission study of the Cs/InP interface formation.
| Autor: | Kendelewicz, T., Soukiassian, P., Bakshi, M. H., Hurych, Z., Lindau, I., Spicer, W. E. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 4, p1331-1335, 5p |
| Databáze: | Complementary Index |
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