Structural characterization of GaAs/ZnSe interfaces.

Autor: Tamargo, M. C., de Miguel, J. L., Hwang, D. M., Farrell, H. H.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 2, p784-787, 4p
Databáze: Complementary Index