Structural characterization of GaAs/ZnSe interfaces.
Autor: | Tamargo, M. C., de Miguel, J. L., Hwang, D. M., Farrell, H. H. |
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Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 2, p784-787, 4p |
Databáze: | Complementary Index |
Externí odkaz: |