Transitions in the reflection high-energy electron-diffraction pattern as a substrate temperature probe in molecular-beam epitaxy.
| Autor: | Ramberg, L. P., Westin, J., Andersson, T. G. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1987, Vol. 5 Issue 6, p1654-1655, 2p |
| Databáze: | Complementary Index |
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