RHEED oscillation studies of MBE growth kinetics and lattice mismatch strain-induced effects during InGaAs growth on GaAs(100).
| Autor: | Lewis, B. F., Lee, T. C., Grunthaner, F. J., Madhukar, A., Fernandez, R., Maserjian, J. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1984, Vol. 2 Issue 3, p419-424, 6p |
| Databáze: | Complementary Index |
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