The step coverage of undoped and phosphorus-doped SiO2 glass films.

Autor: Levin, R. M., Evans-Lutterodt, K.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1983, Vol. 1 Issue 1, p54-61, 8p
Databáze: Complementary Index