Epitaxial TiN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching.
| Autor: | Finnegan, N., Lee, T.-Y., Haasch, R. T., Greene, J. E., Petrov, I. |
|---|---|
| Zdroj: | Surface Science Spectra; 2000, Vol. 7 Issue 3, p213-220, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|