Epitaxial VN(001) Grown and Analyzed In situ by XPS and UPS. I. Analysis of As-deposited Layers.
| Autor: | Haasch, R. T., Lee, T. -Y., Gall, D., Greene, J. E., Petrov, I. |
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| Zdroj: | Surface Science Spectra; 2000, Vol. 7 Issue 3, p221-232, 12p |
| Databáze: | Complementary Index |
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