PSPICE analysis of a scanning capacitance microscope sensor.

Autor: Buh, G. H., Tran, Chi, Kopanski, J. J.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 2004, Vol. 22 Issue 1, p417-421, 5p
Databáze: Complementary Index