PSPICE analysis of a scanning capacitance microscope sensor.
Autor: | Buh, G. H., Tran, Chi, Kopanski, J. J. |
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Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 2004, Vol. 22 Issue 1, p417-421, 5p |
Databáze: | Complementary Index |
Externí odkaz: |