Path delay test compaction with process variation tolerance.
| Autor: | Kajihara, Seiji, Fukunaga, Masayasu, Wen, Xiaoqing, Maeda, Toshiyuki, Hamada, Shuji, Sato, Yasuo |
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| Zdroj: | DAC: Annual ACM/IEEE Design Automation Conference; Jun2005, p845-850, 6p |
| Databáze: | Complementary Index |
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