Investigation of ion-beam-sputtered Nb-Ti thin films by complementary use of backscattering and nuclear-reaction microanalysis.
| Autor: | Bouchier, Daniel, Gautherin, Guy, Agius, Bernard, Rigo, Serge |
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| Zdroj: | Journal of Applied Physics; Dec1978, Vol. 49 Issue 12, p5896-5902, 7p |
| Databáze: | Complementary Index |
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