The thin-film formation of rhodium silicides.

Autor: Petersson, S., Anderson, R., Baglin, J., Dempsey, J., Hammer, W., d'Heurle, F., LaPlaca, S.
Zdroj: Journal of Applied Physics; Jan1980, Vol. 51 Issue 1, p373-382, 10p
Databáze: Complementary Index