Accuracy in the Use of Electron-Diffraction Spot Patterns for Determining Crystal Orientations.
| Autor: | Laird, C., Eichen, E., Bitler, W. R. |
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| Zdroj: | Journal of Applied Physics; May1966, Vol. 37 Issue 6, p2225-2231, 7p |
| Databáze: | Complementary Index |
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