Metal-Semiconductor Barrier-Height Measurement by the Differential Capacitance Method-Degenerate One-Carrier System.
| Autor: | Goodman, Alvin M., Perkins, David M. |
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| Zdroj: | Journal of Applied Physics; Nov1964, Vol. 35 Issue 11, p3351-3353, 3p |
| Databáze: | Complementary Index |
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