Defect structure induced during forward-bias degradation of GaP green-light-emitting diodes.
| Autor: | Petroff, P. M., Lorimor, O. G., Ralston, J. M. |
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| Zdroj: | Journal of Applied Physics; Apr1976, Vol. 47 Issue 4, p1583-1588, 6p |
| Databáze: | Complementary Index |
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