| Autor: |
Artemov, A. S., Astrakharchik, G. F., Baıgachev, Yu. K., Gevorkov, A. K. |
| Předmět: |
|
| Zdroj: |
Technical Physics; Jan2000, Vol. 45 Issue 1, p116, 5p |
| Abstrakt: |
The possibility of diagnosing an ion beam by light emission from the drift chamber is demonstrated using a 2-MeV H[sup –] ion beam as an example. For a local gas puffing and negligible beam losses, spatial characteristics of the beam and the time behavior of the current pulse were monitored and the falling of a small number of ions onto the vacuum-chamber wall was recorded. A profilometer for recording the emission from individual layers of the observed region is described. © 2000 MAIK “Nauka / Interperiodica”. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
