| Autor: |
Kompan, M. E., Salonen, J., Shabanov, I. Yu. |
| Předmět: |
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| Zdroj: |
Journal of Experimental & Theoretical Physics; Feb2000, Vol. 90 Issue 2, p324, 6p |
| Abstrakt: |
The birefringence of light in freely suspended samples of porous silicon is observed and investigated. The effect is interpreted as "shape birefringence," i.e., the effect caused by the structure of a material consisting of anisotropic formations with sizes less than the wavelength of the light and with a predominant orientation. It is checked experimentally that the samples do not possess optical activity or optical anisotropy in the plane of the porous-silicon film. It is determined that the effect is observed for polarization of incident light that rules out the possibility of observing birefringence in a uniform optical medium, and it is not observed in the conventional experimental geometry. Qualitative explanations are given for the anomalous character of the observed defect. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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