Low-Temperature Photoluminescence and X-ray Diffractometry Study of In[sub x]Ga[sub 1 – ][sub x]As Quantum Wells.

Autor: Evstigneev, S. V., Imamov, R. M., Lomov, A. A., Sadof’ev, Yu. G., Khabarov, Yu. V., Chuev, M. A., Shipitsin, D. S.
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Zdroj: Semiconductors; Jun2000, Vol. 34 Issue 6, p693, 7p
Abstrakt: The structures grown by molecular-beam epitaxy with In[sub x]Ga[sub 1-x]As quantum wells (QWs) in GaAs were studied by X-ray diffractometry and low-temperature photoluminescence techniques. The inhomogeneity of the QW composition along the growth direction was established. Energy positions of the exciton recombination lines in the QWs with step-graded In distribution were calculated, and good agreement with the experimental data was obtained. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index