| Autor: |
Burrafato, G., Troja, S., Turrisi, E., Marletta, G., Torrisi, A. |
| Zdroj: |
Il Nuovo Cimento della Societa Italiana di Fisica: D; 1988, Vol. 10 Issue 4, p463-471, 9p |
| Abstrakt: |
The morphological structure of SnTe very thin films is here studied by X-ray photoemission spectroscopy, by transmission electron spectroscopy and by X-ray diffraction. The analisys of experimental data evidences the superficial confinement of Sn, with different oxidation states, and the Te excess in the inner layers. The energy shift of the valence band peaks is attributed to modifications induced by the nonstoichiometry of the compound. Preliminary Hall and resistivity measurements seem to confirm the structural obtained results. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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