| Autor: |
Anazia, Cyril, Lee, Chang-Ou, Jerner, R., Christensen, James, Peavey, Jerris |
| Zdroj: |
Metallurgical transactions. Part A: Physical Metallurgy & Materials Science; 1975, Vol. 6 Issue 9, p1751-1753, 3p |
| Abstrakt: |
A computer algorithm for the rapid solution of Laue back reflection patterns of sapphire crystals is described, (although other hexagonal systems could be indexed with minor changes). Reflections of planes having indices (3, 3, 3) and lower are indexed without using Wulff nets, Greninger charts, and so forth. Any film to specimen distance may be used and the systematic errors associated with this measurement are minimized to determine its best value. The computational scheme compares the angles associated with the reflections from the X-ray patterns and the true interplanar angles which are calculated from the computer program. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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