Chemical sputtering yields of silicon resulting from F+, CFn+ (n = 1,2,3) ion bombardment.

Autor: Miyake, Kiyoshi, Tachi, Shin'ichi, Yagi, Kunihiro, Tokuyama, Takashi
Zdroj: Journal of Applied Physics; Apr1982, Vol. 53 Issue 4, p3214-3219, 6p
Databáze: Complementary Index