Pd-thin-SiO2-Si diode. I. Isothermal variation of H2-induced interfacial trapping states.

Autor: Keramati, Bahman, Zemel, Jay N.
Zdroj: Journal of Applied Physics; Feb1982, Vol. 53 Issue 2, p1091-1099, 9p
Databáze: Complementary Index
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