Tracer study of diffusion and electromigration in thin tin films.
Autor: | Singh, Prabjit, Ohring, Milton |
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Zdroj: | Journal of Applied Physics; Aug1984, Vol. 56 Issue 4, p899-907, 9p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Singh, Prabjit, Ohring, Milton |
---|---|
Zdroj: | Journal of Applied Physics; Aug1984, Vol. 56 Issue 4, p899-907, 9p |
Databáze: | Complementary Index |
Externí odkaz: |