Measurement of the thickness of thin layers by ultrasonic interferometry.
| Autor: | Houze, M., Nongaillard, B., Gazalet, M., Rouvaen, J. M., Bruneel, C. |
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| Zdroj: | Journal of Applied Physics; Jan1984, Vol. 55 Issue 1, p194-198, 5p |
| Databáze: | Complementary Index |
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