Improved spatial resolution diffusion length measurements in imperfect silicon.
| Autor: | Bell, R. O., Hanoka, J. I. |
|---|---|
| Zdroj: | Journal of Applied Physics; Mar1982, Vol. 53 Issue 3, p1741-1744, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Bell, R. O., Hanoka, J. I. |
|---|---|
| Zdroj: | Journal of Applied Physics; Mar1982, Vol. 53 Issue 3, p1741-1744, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|