Electron transport across aluminum/ultrathin silicon oxide/phosphorus implanted silicon barriers.

Autor: Kikuchi, Akira, Yamamoto, Hiroshi, Iwata, Seiichi, Ikeda, Takahide, Nakata, Kensuke
Zdroj: Journal of Applied Physics; Sep1980, Vol. 51 Issue 9, p4913-4918, 6p
Databáze: Complementary Index