High-temperature H2 anneal of interface defects in electron-beam-irradiated MNOS structures.
| Autor: | Schols, G. A., Maes, H. E., Van Overstraeten, R. J. |
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| Zdroj: | Journal of Applied Physics; Jun1980, Vol. 51 Issue 6, p3194-3197, 4p |
| Databáze: | Complementary Index |
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