Experimental and computer analysis of P+-ion penetration tails in a SIO2-Si two-layer system.
Autor: | Desalvo, A., Galloni, R., Rosa, R., Zignani, F. |
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Zdroj: | Journal of Applied Physics; Apr1980, Vol. 51 Issue 4, p1994-1997, 4p |
Databáze: | Complementary Index |
Externí odkaz: |