Determination of the amorphous content of superconducting films by x-ray diffraction and its relation to transition temperature.
| Autor: | Vander, I., Cadieu, F. J. |
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| Zdroj: | Journal of Applied Physics; Mar1980, Vol. 51 Issue 3, p1481-1483, 3p |
| Databáze: | Complementary Index |
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