An x-ray diffraction study on the microstructure of vapor-deposited fcc lead films: normal and oblique incidences.
| Autor: | Nandi, R. K., Sen Gupta, S. P. |
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| Zdroj: | Journal of Applied Physics; Oct1979, Vol. 50 Issue 10, p6262-6266, 5p |
| Databáze: | Complementary Index |
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