Visualization of thick specimens using a reflection acoustic microscope.
Autor: | Nongaillard, B., Rouvaen, J. M., Bridoux, E., Torguet, R., Bruneel, C. |
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Zdroj: | Journal of Applied Physics; Mar1979, Vol. 50 Issue 3, p1245-1249, 5p |
Databáze: | Complementary Index |
Externí odkaz: |